Identifying Near-Perfect Tunneling in Discrete Metamaterial Loaded Waveguides
Electronics, Vol. 8, 84
Eccleston, K., & Platt, I.
Mu-negative and epsilon-negative loaded waveguides taken on their own are nominally cut-off. In ideal circumstances, and when paired in the correct proportions, tunneling will occur. However, due to losses and constraints imposed by ﬁnite-sized constituent elements, the ability to experimentally demonstrate tunneling may be hindered. A tunnel identiﬁcation method has been developed and demonstrated to reveal tunneling behavior that is otherwise obscured. Using ABCD (voltage-current transmission) matrix formulation, the S-parameters of the mu-negative/epsilon-negative loaded waveguide junction is combined with S-parameters of an epsilon-negative loaded waveguide. The method yields symmetric scattering matrices, which allows the effect of losses to be removed to provide yet clearer identiﬁcation of tunneling.